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Error-resistant 3T-iRAM® technology |
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300 MHz to 400 MHz clock |
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Separate independent Read and Write data ports |
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Concurrent Read/Write transactions are supported |
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Dual DDRII+ interface (data rate is twice clock speed) |
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Pin-compatible with QDRII+™ SRAMs |
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2.0 clock cycle Read latency |
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Burst of 4 Read and Write |
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Separate Port Selects for depth expansion |
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Synchronous internally self-timed Writes |
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Full data coherency |
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2 input clocks and 2 echo clocks |
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1.8 V ±100 mV core power supply |
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1.5 V ±100 mV I/O power supply |
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HSTL I/O with variable drive output buffers |
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ZQ pin for programmable output drive strength |
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QVLD pin indicates valid output data |
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IEEE 1149.1 JTAG-compliant Boundary Scan |
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Lead-free
JEDEC-standard pinout and package |
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165-bump 15mm x 17mm BGA, 1 mm bump pitch |
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Pin-compatible with 9Mb, 18Mb, 36Mb, and 144Mb devices |